Materials and Device Testing
The open access Materials and Device Testing Facility provides access to instrumentation for the high resolution characterization of novel materials and new devices. This facility is home to world class equipment including scanning electron microscopes (SEM) and scanning transmission electron microscopes (STEM) that enable researchers to complete in-depth investigations of material properties, including crystallinity, defects, and microstructure. The facility also has several other tools for determining the composition, crystal structure, and other properties of materials. Complementing the analytical capabilities are Focused Ion Beam systems for fabricating small devices. We provide hands-on one-on-one training in the operation of the instruments and mastery of techniques. We strive to provide our users access to the equipment and expertise necessary for success in their research and development projects. We encourage you to contact us to discuss how we can be of assistance to you.