4D LABS Seminar - Low Energy Ion Scattering

November 03, 2016
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We are pleased to invite you to a special seminar by Dr. Thomas Grehl from ION-TOF hosted by 4D LABS at SFU on Thursday, November 3, 2016!

Dr. Thomas Grehl

ION-TOF GmbH

Low Energy Ion Scattering for the quantitative analysis of the outer atomic layer

 

Low Energy Ion Scattering (LEIS) is a technique that allows the analysis of the outer atomic layer with respect to the elemental composition. Its unique features are;

  • ultimate surface sensitivity (outermost atomic layer)
  • straight-forward quantification even on rough surfaces and insulators
  • non-destructive in-depth information of the first few nm below the sample
  • high detection sensitivity

In LEIS, noble gas ions with a kinetic energy of a few keV are scattered from individual surface atoms. In the Qtac instrument, a dedicated electrostatic analyser allowing large collection efficiency and parallel detection of a range of energies is used for the detection of the elastically scattered ions. From the kinetic energy of the scattered ions, the mass of the scattering partner in the surface can be determined. This analyser design is crucial for the practical application of the technique, as the ion fluence can be kept low enough to avoid the modification of the surface during analysis and still achieve sufficient mass resolution and high sensitivity.

Date: November 3, 2016

Time: 3:30 pm

Location: SSB 7172, SFU Burnaby

Light refreshments to be provided