XRD 2 - Bruker

  • High resolution powder diffraction
  • Powder and thin film samples
  • Thermal/vacuum stage capable of heating samples up to 1200°C
  • Independent Theta & 2-Theta control
  • Multichannel silicon strip detector
  • Goebel mirror for parallel x-ray beam
  • Low angle measurements down to 2°
  • Capillary sample holder for liquid samples

Tool Specs

Tool Status

Manufacturer Bruker
Model D8 Advance
Typical Application High resolution powder diffraction
Location 6140.3
Related Documents Standard Operating Procedure
Training Contact Dennis Hsiao - hsiao@4dlabs.ca